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Embedded Systems Secure Path Verification at the HW/SW Interface
Cabodi, Gianpiero, Camurati, Paolo, Finocchiaro, Sebastiano, Savarese, Francesco, Vendraminetto, DaniloYear:
2017
Language:
english
Journal:
IEEE Design & Test
DOI:
10.1109/mdat.2017.2713393
File:
PDF, 629 KB
english, 2017