Statistical Analysis and Modeling of Random Telegraph Noise...

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IEEE Transactions on Semiconductor Manufacturing 2017

Statistical Analysis and Modeling of Random Telegraph Noise Based on Gate Delay Measurement

Islam, A.K.M. Mahfuzul, Nakai, Tatsuya, Onodera, Hidetoshi
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/TSM.2017.2715168
File:
PDF, 2.88 MB
english, 2017
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