[IEEE 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2016.5.31-2016.6.3)] 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Analysis and Remedy of the Discolor on Back-Side Revealing TSV
Chen, Ming-Hung, Lin, Ting-Chun, Hsiao, Yu-Hsiang, Chiang, Yuan-Feng, Lu, Po-Wei, Huang, Zhe-Hao, Yang, Ping-FengYear:
2016
Language:
english
DOI:
10.1109/ectc.2016.256
File:
PDF, 641 KB
english, 2016