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[ACM Press the 53rd Annual Design Automation Conference - Austin, Texas (2016.06.05-2016.06.09)] Proceedings of the 53rd Annual Design Automation Conference on - DAC '16 - Efficient transistor-level timing yield estimation via line sampling
Awano, Hiromitsu, Sato, TakashiYear:
2016
Language:
english
DOI:
10.1145/2897937.2898016
File:
PDF, 750 KB
english, 2016