Shot noise limit of chemically amplified resists with photodecomposable quenchers used for extreme ultraviolet lithography
Kozawa, Takahiro, Santillan, Julius Joseph, Itani, ToshiroVolume:
56
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.56.066501
Date:
June, 2017
File:
PDF, 851 KB
english, 2017