Highly improved photo-induced bias stability of sandwiched triple layer structure in sol-gel processed fluorine-doped indium zinc oxide thin film transistor
Kim, Dongha, Park, Hyungjin, Bae, Byeong-SooVolume:
6
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4944833
Date:
March, 2016
File:
PDF, 2.01 MB
english, 2016