[IEEE 2016 35th Chinese Control Conference (CCC) - Chengdu, China (2016.7.27-2016.7.29)] 2016 35th Chinese Control Conference (CCC) - Variance analyzed under E-Bayesian Estimation and Hierarchical Bayesian Estimation for diagnosing failure rates
Dai, Wanyi, Li, Siqi, Zhang, Mei, Hu, Yueming, Mei, DongfangYear:
2016
Language:
english
DOI:
10.1109/chicc.2016.7554413
File:
PDF, 277 KB
english, 2016