[IEEE 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS)] - Toyama, Japan (2016.6.26-2016.6.30)] 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS) - Characterization of anti-phase boundaries at a GaP/Si(001) cross-sectional surface on the atomic scale
Prohl, Christopher, Doescher, Henning, Kleinschmidt, Peter, Hannappel, Thomas, Lenz, AndreaYear:
2016
Language:
english
DOI:
10.1109/iciprm.2016.7528660
File:
PDF, 18 KB
english, 2016