Ultramicrohardness tester for use in a scanning electron...

Ultramicrohardness tester for use in a scanning electron microscope

H. Bangert, A. Wagendristel, H. Aschinger
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Volume:
259
Language:
english
Pages:
3
DOI:
10.1007/bf01381766
Date:
February, 1981
File:
PDF, 381 KB
english, 1981
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