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SPIE Proceedings [SPIE Photonics West '98 Electronic Imaging - San Jose, CA (Saturday 24 January 1998)] Machine Vision Applications in Industrial Inspection VI - Machine vision system for inner-wall surface inspection
Zhuang, Bao Hua, Zhang, Wenwei, Rao, A. Ravishankar, Chang, Ning S.Volume:
3306
Year:
1998
Language:
english
DOI:
10.1117/12.301240
File:
PDF, 601 KB
english, 1998