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Dealing with inaccuracies in the analysis on solvent-induced swelling of transparent thin films using in situ spectroscopic ellipsometry in the visible wavelength range
Tempelman, Kristianne, Kappert, Emiel J., Raaijmakers, Michiel J.T., Wormeester, Herbert, Benes, Nieck E.Volume:
49
Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.6191
Date:
June, 2017
File:
PDF, 601 KB
english, 2017