IoT–TEG: Test event generator system

IoT–TEG: Test event generator system

Gutiérrez-Madroñal, L., Medina-Bulo, I., Domínguez-Jiménez, J.J.
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Language:
english
Journal:
Journal of Systems and Software
DOI:
10.1016/j.jss.2017.06.037
Date:
June, 2017
File:
PDF, 791 KB
english, 2017
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