A robust and area-efficient guard ring edge termination technique for 4H-SiC power MOSFETs
Deng, Xiaochuan, Guo, Yuanxu, Dai, Tianxiang, Li, Chengzhan, Chen, Ximing, Chen, Wanjun, Zhang, Yourun, Zhang, BoVolume:
68
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2017.06.019
Date:
September, 2017
File:
PDF, 2.25 MB
english, 2017