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[IEEE 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2016.5.31-2016.6.3)] 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Challenges in Assembly and Reliability of Thin NAND Memory Die
Ye, Ning, Li, Qing, Zhang, Huirong, Ji, Zhongli, Yang, Xiaoyu, Chiu, Chin-Tien, Takiar, HemYear:
2016
Language:
english
DOI:
10.1109/ectc.2016.226
File:
PDF, 1.32 MB
english, 2016