[IEEE 2016 IEEE 16th International Conference on...

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[IEEE 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) - Sendai, Japan (2016.8.22-2016.8.25)] 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) - Relationship between electric properties and surface flatness of (ZnO)x(InN)1−x films on ZnO templates

Matsushima, Koichi, Shiratani, Masaharu, Itagaki, Naho
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Year:
2016
Language:
english
DOI:
10.1109/nano.2016.7751421
File:
PDF, 255 KB
english, 2016
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