[IEEE 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) - Toyama, Japan (2017.2.28-2017.3.2)] 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) - A computational study of fundamentals and design considerations for vertical tunneling field-effect transistor
Luo, Sheng, Low, Kain Lu, Zhang, Xiaoyi, Zhao, Qianyu, Lin, Hsin, Liang, GengchiauYear:
2017
Language:
english
DOI:
10.1109/EDTM.2017.7947510
File:
PDF, 921 KB
english, 2017