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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Developments in X-Ray Tomography X - High-throughput data acquisition and processing for real-time x-ray imaging

Stock, Stuart R., Müller, Bert, Wang, Ge, Vogelgesang, Matthias, Rota, Lorenzo, Ardila Perez, Luis E., Caselle, Michele, Chilingaryan, Suren, Kopmann, Andreas
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Volume:
9967
Year:
2016
Language:
english
DOI:
10.1117/12.2237611
File:
PDF, 302 KB
english, 2016
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