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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Earth Observing Systems XXI - Towards post-launch validation of GOES-R ABI SI traceability with high-altitude aircraft, small near surface UAS, and satellite reference measurements
Butler, James J., Xiong, Xiaoxiong (Jack), Gu, Xingfa, Padula, Francis, Pearlman, Aaron J., Cao, Changyong, Goodman, SteveVolume:
9972
Year:
2016
Language:
english
DOI:
10.1117/12.2238181
File:
PDF, 1.82 MB
english, 2016