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[IEEE 2016 6th Electronic System-Integration Technology Conference (ESTC) - Grenoble, France (2016.9.13-2016.9.15)] 2016 6th Electronic System-Integration Technology Conference (ESTC) - Superior reliability of Fe-45Ni UBM in electromigration
Gao, Li-Yin, Liu, Zhi-Quan, Zhang, Li, Guo, Hongyan, Lai, Chi-MingYear:
2016
Language:
english
DOI:
10.1109/ESTC.2016.7764683
File:
PDF, 14.27 MB
english, 2016