[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Efficient prediction of 28nm path delay degradation under activity uncertainty
Patra, Devyani, Bansal, Ankita, Rao, Richard, Ramamurthy, Anu, Li, Wencheng, Shimelis, Eskinder, Cao, YuYear:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936354
File:
PDF, 422 KB
english, 2017