[IEEE 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) - Sendai, Japan (2016.8.22-2016.8.25)] 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) - Hydrogen diffusion characterization of amorphous Yttrium Stabilized Zirconia dielectrics
Sheikholeslam, S. Arash, Grecu, Cristian, Manzano, Hegoi, Ivanov, AndreYear:
2016
Language:
english
DOI:
10.1109/nano.2016.7751511
File:
PDF, 1.01 MB
english, 2016