SPIE Proceedings [SPIE Second International Workshop on...

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SPIE Proceedings [SPIE Second International Workshop on Pattern Recognition - Singapore, Singapore (Monday 1 May 2017)] Second International Workshop on Pattern Recognition - Face pose tracking using the four-point algorithm

Jiang, Xudong, Arai, Masayuki, Chen, Guojian, Fung, Ho Yin, Wong, Kin Hong, Yu, Ying Kin, Tsui, Kwan Pang, Kam, Ho Chuen
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Volume:
10443
Year:
2017
Language:
english
DOI:
10.1117/12.2280307
File:
PDF, 624 KB
english, 2017
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