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SPIE Proceedings [SPIE Second International Workshop on Pattern Recognition - Singapore, Singapore (Monday 1 May 2017)] Second International Workshop on Pattern Recognition - Fault prevention by early stage symptoms detection for automatic vehicle transmission using pattern recognition and curve fitting
Jiang, Xudong, Arai, Masayuki, Chen, Guojian, Balbin, Jessie R., Cruz, Febus Reidj G., Abu, Jon Ervin A., Siño, Carlo G., Ubaldo, Paolo E., Zulueta, Christelle Jianne T.Volume:
10443
Year:
2017
Language:
english
DOI:
10.1117/12.2280824
File:
PDF, 1.20 MB
english, 2017