Gallium In-Depth Profile in Bromine- Etched...

Applied Spectroscopy 2017 / 06 Vol. 71; Iss. 6

Gallium In-Depth Profile in Bromine- Etched Copper–Indium–Galium–(Di)selenide (CIGS) Thin Films Inspected Using Raman Spectroscopy

Parravicini, Jacopo, Acciarri, Maurizio, Lomuscio, Alberto, Murabito, Matteo, Le Donne, Alessia, Gasparotto, Andrea, Binetti, Simona
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
71
Language:
english
Journal:
Applied Spectroscopy
DOI:
10.1177/0003702816681568
Date:
June, 2017
File:
PDF, 383 KB
english, 2017
Conversion to is in progress
Conversion to is failed