![](/img/cover-not-exists.png)
[IEEE 2017 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - St. Petersburg and Moscow, Russia (2017.2.1-2017.2.3)] 2017 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - The study of RF frontend characteristics influence to SAR image quality
Lyalin, Konstantin S., Tsvetkov, Vadim K., Sheremet, Alexey Y., Vatskov, Pavel Y., Biryuk, Alexey A.Year:
2017
Language:
english
DOI:
10.1109/EIConRus.2017.7910792
File:
PDF, 292 KB
english, 2017