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[IEEE 2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS) - Bariloche, Argentina (2017.2.20-2017.2.23)] 2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS) - Process and temperature impact on single-event transients in 28nm FDSOI CMOS
Bartra, Walter Calienes, Vladimirescu, Andrei, Reis, RicardoYear:
2017
Language:
english
DOI:
10.1109/LASCAS.2017.7948062
File:
PDF, 206 KB
english, 2017