OCVD Lifetime Measurements on 4H-SiC Bipolar Planar Diodes:...

IEEE Transactions on Electron Devices 2017 / 6 Vol. 64; Iss. 6

OCVD Lifetime Measurements on 4H-SiC Bipolar Planar Diodes: Dependences on Carrier Injection and Diode Area

Sozzi, Giovanna, Puzzanghera, Maurizio, Chiorboli, Giovanni, Nipoti, Roberta
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Volume:
64
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2691280
Date:
June, 2017
File:
PDF, 1.26 MB
english, 2017
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