Hot-Carrier-Induced Degradations and Optimizations for...

  • Main
  • 2017
  • Hot-Carrier-Induced Degradations and Optimizations for...
IEEE Transactions on Electron Devices 2017

Hot-Carrier-Induced Degradations and Optimizations for Lateral DMOS Transistor With Multiple Floating Poly-Gate Field Plates

Liu, Siyang, Ren, Xiaofei, Fang, Yunchao, Sun, Weifeng, Su, Wei, Ma, Shulang, Lin, Feng, Liu, Yuwei, Sun, Guipeng
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2711276
File:
PDF, 2.17 MB
english, 2017
Conversion to is in progress
Conversion to is failed