SPIE Proceedings [SPIE Second International Workshop on Pattern Recognition - Singapore, Singapore (Monday 1 May 2017)] Second International Workshop on Pattern Recognition - Comparison expert and novice scan behavior for using e-learning
Jiang, Xudong, Arai, Masayuki, Chen, Guojian, Novita Sari, Felisia, Insap Santosa, Paulus, Wibirama, SunuVolume:
10443
Year:
2017
Language:
english
DOI:
10.1117/12.2280731
File:
PDF, 593 KB
english, 2017