Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2017 / 1 Vol. 11; Iss. 1
![](/img/cover-not-exists.png)
Use of models of secondary X-ray fluorescence spectra to determine the measurement conditions in X-ray spectral methods of material analysis
A. V. Romanov,M. A. Stepovich…Volume:
11
Language:
english
Journal:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
DOI:
10.1134/S1027451017010335
Date:
January, 2017
File:
PDF, 478 KB
english, 2017