Time-of-flight measurements of heavy ions using Si PIN...

Time-of-flight measurements of heavy ions using Si PIN diodes

A. O. Strekalovsky,D. V. Kamanin,Yu. V. Pyatkov…
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Volume:
79
Language:
english
Journal:
Physics of Atomic Nuclei
DOI:
10.1134/S1063778816090131
Date:
December, 2016
File:
PDF, 1.04 MB
english, 2016
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