Spectroscopic ellipsometry studies on the m -plane Al 1− x In x N epilayers grown by metalorganic vapor phase epitaxy on a freestanding GaN substrate
Kojima, Kazunobu, Kagaya, Daiki, Yamazaki, Yoshiki, Ikeda, Hirotaka, Fujito, Kenji, Chichibu, Shigefusa F.Volume:
55
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.55.05FG04
Date:
May, 2016
File:
PDF, 1011 KB
english, 2016