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Characterization of raw materials and self-organized Bi 2 O 3 -Ag eutectic by X-ray diffraction, scanning electron microscopy, and X-ray photoelectron spectroscopy
Szubka, Magdalena, Talik, Ewa, Sadecka, Katarzyna, Pawlak, Dorota Anna, Zajdel, Pawel, Guzik, AdamLanguage:
english
Journal:
Crystal Research and Technology
DOI:
10.1002/crat.201700044
Date:
June, 2017
File:
PDF, 1.76 MB
english, 2017