[IEEE 2016 IEEE International Conference on Big Data (Big Data) - Washington DC,USA (2016.12.5-2016.12.8)] 2016 IEEE International Conference on Big Data (Big Data) - Modeling, validation and verification of cell-scaffold contact measurements over terabyte-sized 3D image collection
Bajcsy, Peter, Yoon, Soweon, Simon, Mylene, Brady, Mary, Sriram, Ram, Hotaling, Nathan, Schaub, Nicholas, Simon, Carl G., Szczypinski, Piotr M., Florczyk, Stephen J.Year:
2016
Language:
english
DOI:
10.1109/BigData.2016.7841072
File:
PDF, 716 KB
english, 2016