[IEEE 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Dresden, Germany (2017.4.19-2017.4.21)] 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - A fast and flexible HW/SW co-processing framework for Time-of-Flight 3D imaging
Druml, Norbert, Ehrenhoefer, Christoph, Bell, Walter, Gailer, Christian, Plank, Hannes, Herndl, Thomas, Holweg, GeraldYear:
2017
Language:
english
DOI:
10.1109/DDECS.2017.7934585
File:
PDF, 791 KB
english, 2017