[IEEE 2017 IEEE Electron Devices Technology and...

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[IEEE 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) - Toyama, Japan (2017.2.28-2017.3.2)] 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) - 3D time-contingent physical unclonable function array on 16nm FinFET dielectric RRAM

Chang, Yi-Hung, Yeh, Po Shao, Chih, Yue-Der, Chang, Jonathan, King, Ya-Chin, Lin, Chrong Jung
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Year:
2017
Language:
english
DOI:
10.1109/EDTM.2017.7947558
File:
PDF, 971 KB
english, 2017
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