[IEEE 2016 IEEE Photonics Conference (IPC) - Waikoloa, HI, USA (2016.10.2-2016.10.6)] 2016 IEEE Photonics Conference (IPC) - Contrast ratio and noise tolerance in multisymbol-QPSK-label recognition devices
Inoshita, Kensuke, Makimoto, Yoshihiro, Kishikawa, Hiroki, Goto, Nobuo, Yanagiya, Shin-ichiroYear:
2016
Language:
english
DOI:
10.1109/IPCon.2016.7831288
File:
PDF, 765 KB
english, 2016