Bending Stress Induced Performance Change in Plastic Oxide Thin-film Transistor and Recovery by Annealing at 300°C
Hasan, Md Mehedi, Billah, Mohammad Masum, Naik, Mude Narendra, Um, Jae Gwang, Jang, JinYear:
2017
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2017.2718565
File:
PDF, 874 KB
english, 2017