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Investigation on the Worst Read Scenario of a ReRAM Crossbar Array
Youn, Yelim, Kim, Kwangmin, Sim, Jae-Yoon, Park, Hong-June, Kim, ByungsubYear:
2017
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2017.2710140
File:
PDF, 2.55 MB
english, 2017