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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Experimental comparison of photogrammetry for additive manufactured parts with and without laser speckle projection
Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Sims-Waterhouse, D., Bointon, P., Piano, S., Leach, R. K.Volume:
10329
Year:
2017
Language:
english
DOI:
10.1117/12.2269507
File:
PDF, 737 KB
english, 2017