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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Automated Visual Inspection and Machine Vision II - A novel sparse-to-dense depth map generation framework for monocular videos
Beyerer, Jürgen, Puente León, Fernando, Zhang, Runze, Cao, Zhiguo, Zhang, Qian, Xiao, Yang, Li, RuiboVolume:
10334
Year:
2017
Language:
english
DOI:
10.1117/12.2269885
File:
PDF, 473 KB
english, 2017