SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Subpixel edge estimation with lens aberrations compensation based on the iterative image approximation for high-precision thermal expansion measurements of solids
Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Inochkin, F. M., Kruglov, S. K., Bronshtein, I. G., Kompan, T. A., Kondratjev, S. V., Korenev, A. S., Pukhov, N. F.Volume:
10329
Year:
2017
Language:
english
DOI:
10.1117/12.2270204
File:
PDF, 1.78 MB
english, 2017