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Improving Smartphone Security and Reliability
NEAMTIU, IULIAN, WEI, XUETAO, FALOUTSOS, MICHALIS, GOMEZ, LORENZO, AZIM, TANZIRUL, HU, YONGJIAN, SHAN, ZHIYONGVolume:
17
Language:
english
Journal:
Journal of Interconnection Networks
DOI:
10.1142/S0219265917400023
Date:
March, 2017
File:
PDF, 4.14 MB
english, 2017