Non-homogenous gamma process: Application to SiC MOSFET...

  • Main
  • 2017 / 6
  • Non-homogenous gamma process: Application to SiC MOSFET...
Microelectronics Reliability 2017 / 6

Non-homogenous gamma process: Application to SiC MOSFET threshold voltage instability

Santini, Thomas, Morand, Sebastien, Fouladirad, Mitra, Miller, Florent, Grall, Antoine, Allard, Bruno
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.06.007
Date:
June, 2017
File:
PDF, 943 KB
english, 2017
Conversion to is in progress
Conversion to is failed