Open Challenges for Probabilistic Measurement-Based...

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IEEE Embedded Systems Letters 2017

Open Challenges for Probabilistic Measurement-Based Worst-Case Execution Time

Jimenez Gil, Samuel, Bate, Iain, Lima, George, Santinelli, Luca, Gogonel, Adriana, Cucu-Grosjean, Liliana
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Year:
2017
Language:
english
Journal:
IEEE Embedded Systems Letters
DOI:
10.1109/LES.2017.2712858
File:
PDF, 151 KB
english, 2017
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