Heterogeneous Defect Prediction

IEEE Transactions on Software Engineering 2017

Heterogeneous Defect Prediction

Nam, Jaechang, Fu, Wei, Kim, Sunghun, Menzies, Tim, Tan, Lin
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Software Engineering
DOI:
10.1109/TSE.2017.2720603
File:
PDF, 885 KB
english, 2017
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