SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Videometrics, Range Imaging, and Applications XIV - Localisation accuracy of semi-dense monocular SLAM
Remondino, Fabio, Shortis, Mark R., Schreve, Kristiaan, Du Plessies, Pieter G., Rätsch, MatthiasVolume:
10332
Year:
2017
Language:
english
DOI:
10.1117/12.2270163
File:
PDF, 1.58 MB
english, 2017