SPIE Proceedings [SPIE SPIE Optical Metrology - Munich,...

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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - A hybrid structured-light measurement using a laser projector

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Guo, Jiayu, Zhou, Xiang, Li, Dong, Wang, Chao, Fei, Zixuan, Li, Huanhuan
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Volume:
10329
Year:
2017
Language:
english
DOI:
10.1117/12.2278911
File:
PDF, 617 KB
english, 2017
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