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SPIE Proceedings [SPIE Critical Review Collection - Bellingham, United States (Friday 13 January 2017)] Optical Metrology - Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications

Woollam, John A., Johs, Blaine D., Herzinger, Craig M., Hilfiker, James N., Synowicki, Ron A., Bungay, Corey L.
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Volume:
10294
Year:
2017
Language:
english
DOI:
10.1117/12.351660
File:
PDF, 656 KB
english, 2017
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