[IEEE 2017 12th IEEE International Conference on Automatic...

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[IEEE 2017 12th IEEE International Conference on Automatic Face & Gesture Recognition (FG 2017) - Washington, DC, DC, USA (2017.5.30-2017.6.3)] 2017 12th IEEE International Conference on Automatic Face & Gesture Recognition (FG 2017) - Exploiting Data Redundancy for Error Detection in Degraded Biometric Signatures Resulting From in the Wild Environments

Neves, Joao, Proenca, Hugo
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Year:
2017
Language:
english
DOI:
10.1109/FG.2017.122
File:
PDF, 2.28 MB
english, 2017
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